Speaker: Professor Raynald Gauvin, Mining and Materials Engineering, McGill University
This seminar will present the scanning transmission electron microscope (STEM) SU-9000 from Hitachi which characterizes thin and massive samples with electrons beam energies ranging from 0.1 to 30 keV. This microscope is equipped with an electron energy loss spectroscopy (EELS) detector which allows the detection of Lithium. High spatial resolution images are possible with a resolution of 0.16 nm. Many examples will be presented on Li materials and on nano-materials. This microscope is equipped with a EDS detector of lithium (Extreme, Oxford Instrument) and the microanalysis of lithium compounds, which is very difficult and challenging, will also be covered. The preparation of thin films by focus ion beam (FIB) for high spatial resolution images in STEM will be also shown with the newly acquired Hitachi NX-5000 FIB.
Zoom: https://us06web.zoom.us/j/81688365420?pwd=b3RpdHgxNVhWbWQrbXluMUxYNWVtQT09
Meeting ID: 816 8836 5420 Passcode: 047859.