A free one-hour tour of the capabilities of the Royce Institute's Electrical Characterisation Suite within the Department of Electrical Engineering at the University of Cambridge. Discover more about this open access equipment and Royce funding opportunities for your research.
This equipment can be used to characterise devices in detail both at wafer level and in packaged form enabling the enhancement of product performance.
This suite includes: a Cascade Tesla, 200 mm, high voltage, high current semiautomatic probe station, a Keysight B1505A Semiconductor Parametric Analyser/Curve Tracer, number of stand-alone, high precision Source Measure Units (SMUs) and a high voltage capable, Keysight 2 GHz Oscilloscope.
This set of equipment allows testing and characterisation of devices and materials in wafer, die or packaged forms, very accurately from -55 °C to +300 °C. Ratings of the equipment are up to 200 A and 3 kV for wafer level measurements using the probe station and 0.01 fA to 1500 A and 10 kV for packaged samples. B1505A also has C-V capability from 1 kHz to 5 MHz with a combined DC voltage rating of 3 kV. The oscilloscope with the high voltage probe can capture switching transients up to 4 kV.
For more information about Royce Facilities at Cambridge please contact royce@maxwell.cam.ac.uk and see our full equipment listing at: https://www.maxwell.cam.ac.uk/programmes/henry-royce-institute