Royce training: Introduction to the Bruker Wafer-Scale AFM

Speaker: Dr Peter de Wolf (Bruker)

OPEN TO ALL UK HEI AND INDUSTRY

On Monday 6 November 2017 Peter de Wolf from Bruker will be visiting the Department of Materials Science (MSM) to talk about the new Bruker Wafer-Scale AFM installed at MSM as part of the Cambridge spoke of the Henry Royce Institute Facilities. Peter will provide advanced training on the new AFM system.

Peter is the Applications Manager at Bruker and is in charge of the development of new modes of imaging within the company, particularly modes for the examination of materials properties at the nanoscale.

In this training seminar, Dr Rachel Oliver will initially give a short introduction to the AFM for a non-specialist audience and then briefly explain the capability we have in materials property measurement which is carried forward from the older Dimension 3100, which the new Royce system replaces. Peter will then talk, at rather more length, about the new capabilities of the Royce system.  There should be plenty of time for questions after the talks.

This seminar is a great opportunity for potential users to come along and learn about the system's capabilities.  Peter is one of the most expert people in the world on materials property measurement in AFM, so it would be great if lots of people could come to the seminar and get to know the system a bit better!

If you are interested in running samples on the system, please email Dr Rachel Oliver (rao28@cam.ac.uk) about this (in advance).